MessTec - The Facilities and Instrumentation Data Base of DLR

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Results 1-5 of 32

Analytical Transmission Electron

DLR Institute of Materials Research

The analytical transmission electron microscope is used to study microstructural features on a submicron to nanometre scale. Typical examples are concentration profiles of high spatial resolution, detection of grain boundary phases and segregations, evidence of orientation relationships between adjacent phases, and analyses of dislocations. The analytical transmission electron microscope combines three modes of high-resolution materials characterization, i.e.

Automated Hall facility - Determination of electric transport properties

DLR Institute of Materials Research

Fundamental semiconductor properties like concentration and mobility of charge carriers (electrons, holes) provide information for application-oriented materials optimisation. An optimal magnitude of the carrier density has to be adjusted to achieve the maximal thermoelectric figure of merit of semiconductors.

Biaxial testing equipment

DLR Institute of Materials Research

Biaxial testing equipment for flat test pieces from 100 mm * 100 mm up to 1000 mm * 1500 mm. With the four servo-hydraulic pistons tests with dynamic loads up to 1000 kN can be performed. The maximum testing frequency amounts to 20 Hz..

CO2 high-pressure extraction plants

DLR Institute of Materials Research

The high-pressure drying units HPE-LAB-150 (extraction tank with an internal diameter of 185 mm and a capacity of 12 L) and the HPTE-150p (extraction tank with an internal diameter of 475 mm and a capacity of 60 L) are designed for the supercritical drying of lyogels to aerogels and for the optimization of the supercritical extraction process.

CTEM – Combined ThermoElectric Measurement

DLR Institute of Materials Research

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Results 1-5 of 32