Atomic force microscopy

Measured values

  • Surface profile and surface roughness of plane samples, especially optics

Principle

Surface scanning by the atomic force principle in contact or non-contact mode. Maximum scanning area: 100x100µm²

Application

Investigation of surface fine structure with nm resolution

Institute / Organization

DLR Institute of Technical Physics

Contact

Gabriele Taube
DLR Institute of Technical Physics

Dr. phil. nat. Dorothee Maria Rück
Technology Marketing

Similar Measures

Subsequent references to data sheets are given which describe with high probability similar measured values. The selection is made on the basis of semantic affinity:

Surface profile and surface roughness of plane samples, especially optics :: more