MessTec - The Facilities and Instrumentation Data Base of DLR

1 | 2
Results 1-5 of 6

Atomic force microscopy

DLR Institute of Technical Physics

Surface scanning by the atomic force principle in contact or non-contact mode. Maximum scanning area: 100x100µm².

Fourier Transform Infrared Spectroscopy (FT-IR)

DLR Institute of Technical Physics

Main components of an FT-IR spectrometer are a broadband light source, a Michelson-interferometer and an appropriate detector (Si or Ge). By tuning one interferometer arm, an interferogram is recorded. This interferogram is then Fourier transformed and a characteristic transmission or reflection spectrum of the sample is obtained. Measuring ranges are 0.7 -1.2 µm, 1.0 -2.5 µm and 2.5-25 µm..

High-Speed Camera

DLR Institute of Technical Physics

· Redlake MotionPro X3 · Sensor: CMOS 1280*1024 · 1040 frames per second in full resolution · 64.000 frames per second in partial resolution · Connectivity: Gigabit-Ethernet.

Laser-Calorimetric Measurement System

DLR Institute of Technical Physics

With the laser-calorimetric measurement system the absorption values of optical components are determined according to the DIN EN ISO 11551:2003 standard. The sample is irradiated for approximately 100 seconds with a laser (time varies with sample properties). This causes heating of the sample due to partial absorption of the laser power. To reduce thermal disturbances the sample is located inside an insulating chamber.

Laser-induced damage threshold (LIDT) measurements of optical components

DLR Institute of Technical Physics

According to DIN EN ISO 21254-1:2011 and DIN EN ISO 21254-2:2011 optical components are irradiated with pulsed laser light and the occurrence of damage is monitored online by scattering light detection. In case of tests in vacuum pressure detection is used in addition. Any change observable under Nomarski microscope is defined as a laser-induced damage. The system has a detection resolution in the order of µm damage size.

1 | 2
Results 1-5 of 6